Fostering Design and Automation of
Electronic and Embedded Systems

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  • Design & Test is happy to welcome Prof. Joerg Henkel (Karlsruhe Institute of Technology) as its new Editor in Chief!
  • Design & Test welcomes several new members to its editorial board, effective Jan. 1st 2016!

LATEST NEWSLETTER & ISSUE

 

Design & Test
Magazine
Volume 34, Issue 2 (March/April)

CEDA: IEEE Council on Electronic Design Automation

CAS: Circuits & Systems Society

TTTC: Test Technology Technical Council

SSCS: IEEE Solid-State Circuits Society

IEEE

 


Highlights

Special Issue on "Computing in the Dark Silicon Era"

 

Perspective by Marilyn Wolf, "The Physics of Event-Driven IoT Systems"

In Memoriam, Edward J. McCluskey 1929-2016
(Free Access)


March/April 2017 Content


From the EIC

Power Density

 

View full article (PDF) here.


Computing in the Dark Silicon Era

Guest Editors' Introduction: Computing in the Dark Silicon Era

 

View full article (PDF) here.

Computing in the Dark Silicon Era: Current Trends and Research Challenges

 

Power density has become the major constraint for many on-chip designs. As an introduction to the Special Issue on Dark Silicon, the authors ... read more.

View full article (PDF) here.

Near Threshold Voltage (NTV) Computing: Computing in the Dark Silicon Era

 

Near-threshold computing has emerged as an attractive paradigm for energy efficiency. This article discusses ... read more.

View full article (PDF) here.

Impact of FinFET on Near-Threshold Voltage Scalability

 

Near-threshold operations provide a powerful knob for improving energy efficiency and alleviating on-chip power densities. This article ... read more.

View full article (PDF) here.

Dark Memory and Accelerator-Rich System Optimization in the Dark Silicon Era

 

Unlike traditional dark silicon works that attack the computing logic, this article puts a focus on the memory part, which dissipates most of the energy for memory-bound CPU applications. This article discusses ... read more.

View full article (PDF) here.

Can Dark Silicon Be Exploited to Prolong System Lifetime?

 

Besides stringent power and thermal constraints, a dark silicon chip is also subjected to various reliability threats. This article illustrates ... read more.

View full article (PDF) here.

AxBench: A Multiplatform Benchmark Suite for Approximate Computing

 

Approximate computing is claimed to be a powerful knob for alleviating the peak power and energy-efficiency issues. However, ... read more.

View full article (PDF) here.


General Interest Papers

Controller Architecture for Low-Power, Low-Latency DRAM With Built-in Cache

 

Memory wall is a critical issue for many today's electronic systems. Tiered latency DRAM with asymmetric bit lines was proposed to optimize the power and latency. This paper proposes ... read more.

View full article (PDF) here.

A Fully Automated and Configurable Cost-Aware Framework for Adaptive Functional Diagnosis

 

This paper presents an approach that enables users to tune the board diagnosis process in order to trade off ... read more.

View full article (PDF) here.


Departments

The Physics of Event-Driven IoT Systems

 

Access Article (PDF) here.

Highlights of ICCAD 2016

 

Free Access Article (PDF) here.

Edward J. McCluskey 1929-2016

 

Free Access Article (PDF) here.

Dark Silicon, Antiparallelism, and Too Much Work

 

Free Access Article (PDF) here.


Click for Table-of-Contents.


Jörg Henkel, KIT, Karlsruhe
Editor-in-Chief



Current Issue Details (Vol. 34, Issue 2)

 

Mar17Cover Correct

Table of Contents

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