IEEE Design & Test Magazine seeks original and visionary research work describing methods used to design and test from the physical layer all the way up to things and systems of systems. Besides research articles, the magazine focuses on current and future practice in form of perspectives, interviews, roundtables, tutorials, standards, reviews and reports. Topics of Interest include, but are not limited to:
IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards. IEEE Design & Test is cosponsored with the IEEE Council on Electronic Design and Automation, IEEE Circuits and Systems Society, the IEEE Solid State Circuits Society and the Test Technology Technical Council.
Authors can submit manuscripts for publication on any topic within Design & Test's scope at any time. All articles are peer-reviewed before publication and are limited in length by 5,000 words (each figures counts 300 words). In addition to research articles, Design & Test publishes numerous columns to which you can also contribute. If interested in contributing to a column, please contact the specific editor (see back page of this flyer).
Submission instructions: http://ieee-ceda.org/publications/d-t/paper-submission
Submission site: https://mc.manuscriptcentral.com/dandt
Call for Special Issues
Submit a Word, pdf, text, or PostScript version of your submission to Manuscript Central.
Current Special Issues
- NEW! Special Issue Call for Papers: Special Issue on Automotive Reliability and Test Strategies - Papers Due: April 6th, 2017
- NEW! Special Issue Call for Papers: Special Issue on Cross-layer Design of Cyber-Physical Systems - Papers Due: June 30th, 2017
- NEW! Special Issue Call for Papers: Special Issue on Time-Critical Systems Design - Papers Due: March 31st, 2017
- NEW! Special Issue Call for Papers: Special Issue on Self-Awareness in Systems-on-Chip - EXTENDED: January 31st, 2017
EXTENDED! Special Issue Call for Papers: Special Issue on Energy and Power Management for Electric Vehicles - EXTENDED: Papers Due: April 10th, 2017.
EXPIRED Special Issue Call for Papers: Special Issue on Emerging Challenges and Solutions in SoC Verification - Papers Due: October 31st, 2016.
EXPIRED Special Issue Call for Papers: Special Issue on Hardware Accelerators for Data Centers - Papers Due: December 19th, 2016.
EXPIRED Special Issue Call for Papers: Special Issue on Critical and Enabling Techniques for Emerging Memories- Papers Due: June 30th, 2016.
EXPIRED Special Issue Call for Papers: Special Issue on Cyber-Physical Systems Security and Privacy - Papers Due: June 1st, 2016.
EXPIRED Special Issue Call for Papers: Special Issue on Computing in the Dark Silicon EraComputing in the Dark Silicon Era - Papers Due: January 31st, 2016.
EXPIRED Special Issue Call for Papers: Special Issue on The Challenges and Opportunities in Analog/Mixed Signal CAD - Papers Due: December 15th, 2015.