Fostering Design and Automation of
Electronic and Embedded Systems

 

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IEEE Design & Test Magazine General Call for Contributions

IEEE Design & Test Magazine seeks original and visionary research work describing methods used to design and test from the physical layer all the way up to things and systems of systems. Besides research articles, the magazine focuses on current and future practice in form of perspectives, interviews, roundtables, tutorials, standards, reviews and reports. Topics of Interest include, but are not limited to:

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IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards. IEEE Design & Test is cosponsored with the IEEE Council on Electronic Design and Automation, IEEE Circuits and Systems Society, the IEEE Solid State Circuits Society and the Test Technology Technical Council.

Authors can submit manuscripts for publication on any topic within Design & Test's scope at any time. All articles are peer-reviewed before publication and are limited in length by 5,000 words (each figures counts 300 words). In addition to research articles, Design & Test publishes numerous columns to which you can also contribute. If interested in contributing to a column, please contact the specific editor (see back page of this flyer).

Submission instructions: http://ieee-ceda.org/publications/d-t/paper-submission

Submission site: https://mc.manuscriptcentral.com/dandt

Call for Special Issues

Design & Test has a strong history of Special Issues that often set new trends or even established new research branches with respect to design and test aspects. These are leading-edge, forward-looking topics by Guest Editors who are the leaders in their respective fields. Design & Test always seeks high-profile Guest Editors to conduct Special Issues in the magazine. Though proposals are often solicited by the Editor-In-Chief (EIC) or Members of the Editorial Board, it is highly encouraged to send unsolicited proposal to the EiC. Please send your proposal to Jรถrg Henkel, Karlsruhe Institute of Technology, (This email address is being protected from spambots. You need JavaScript enabled to view it.). Detailed Guidelines for submitting Special Issue proposals can be found here:

http://ieee-ceda.org/publications/d-t/paper-submission/guest-editor-info

 

Submission Information

Submit a Word, pdf, text, or PostScript version of your submission to Manuscript Central.

Download the General Call for Papers and Call for Special Issues

Current Special Issues

  • NEW! Special Issue Call for Papers: Special Issue on Architecture Advances Enabled by Emerging Technologies - Papers Due: September 15th, 2017
    Guest Editor Contact: Sharon Hu (This email address is being protected from spambots. You need JavaScript enabled to view it.)
  • NEW! Special Issue Call for Papers: Special Issue on Secure Automotive Systems - Papers Due: September 30th, 2017
    Guest Editor Contact: Sandip Ray (This email address is being protected from spambots. You need JavaScript enabled to view it.)
  • NEW! Special Issue Call for Papers: Special Issue on Cross-layer Design of Cyber-Physical Systems - Papers Due: EXTENDED: September 1st, 2017
    Guest Editor Contact: Anuradha Annaswamy (This email address is being protected from spambots. You need JavaScript enabled to view it.)