The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin American to present and discuss various aspects of system, board, and component testing and fault-tolerance with design, manufacturing and field considerations in mind. Conference content will be submitted for inclusion into IEEE Xplore as well as other Abstracting and Indexing (A&I) databases. The best papers of the 20th LAT will be invited to re-submit to IEEE Design and Test of Computers, Journal of Electronic Testing: Theory and Applications JETTA (Springer), Journal of Low Power Electronics-JOLPE (American Scientific Publishers) and IEEE Transactions on Computer-Aided Design (TCAD)