Test Technology Technical Council (TTTC)’s interests encompass a wide variety of technologies since each area of electronic test depends on its own specialized instrumentation and techniques. A number of technologies are usually needed to test a single product thereby increasing the challenge. TTTC’s current scope includes, but is not limited to: Testing of analog, digital, memory, FPGA, SiP, and RF Semiconductor circuits Testing of embedded cores, integrated circuits, MCMs, boards, and systems Testability methods: built-in self-test, scan, and test synthesis Verification and Validation Embedded Test, ATE, Test resource partitioning Yield Optimization, defect/fault tolerance, and embedded repair methodologies Infrastructure IP On-line, IDDQ, thermal testing Transient faults, soft errors, robustness, field reliability Debug and Diagnosis TTTC Website Chair(s): Peilin Song IBM Thomas J. Watson Research Center United States 1 (Northeastern U.S.) Email
