Aim & Scope
IEEE Design&Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and round-table discussions.
Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards. IEEE Design & Test is cosponsored with the IEEE Council on Electronic Design and Automation, IEEE Circuits and Systems Society, and the IEEE Solid-State Circuits Society.
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IEEE Design & Test (ISSN 0740-7475) is published bimonthly by the Institute of Electrical and -Electronics -Engineers, Inc. Headquarters: 3 Park Avenue, 17th Floor, New York, NY 10016-5997 USA. Responsibility for the contents rests upon the authors and not upon the IEEE, the Society, or its members. IEEE Operations Center (for orders, subscriptions, address changes): 445 Hoes Lane, Piscataway, NJ 08854 USA. Telephone: +1 732 981 0060, +1 800 678 4333.
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Published by: IEEE Council on Electronic Design and Automation
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