Current Calls
- NEW: Special Issue on Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems - Papers Due: 4th November, 2020; Guest Editor Contact: Mario Barbareschi ([email protected])
- NEW: Special Issue on Benchmarking Machine Learning Systems and Applications - Papers Due: 1 September 2020; Guest Editor Contact: Sai Manoj ([email protected] )
- EXTENDED: Special Issue on Near-Memory and In-Memory Processing - Papers Due: 15 July 2020; Guest Editor Contact: Hai "Helen" Li ([email protected] )
- EXTENDED: Special Issue on Stochastic Computing for Neuromorphic Architectures - Papers Due: 15 June 2020; Guest Editor Contact: Ilia Polian ([email protected])
In Progress & Former Special Issues
- IN PROGRESS: Special Issue Call for Papers: Education for Cyber-Physical Systems- Papers Due: 10 January 2020; Guest Editor Contact: Peter Marwedel ([email protected])
- IN PROGRESS: Special Issue Call for Papers: Open-Source EDA - Papers Due: 15 February 2020; Guest Editor Contact: Sherief Reda ([email protected])
- IN PROGRESS: Special Issue Call for Papers: Design and Test Solutions for Embedded Systems with Non-volatile Memories - Papers Due: October 1st, 2019; Guest Editor Contact: Jian-Jia Chen ([email protected])
- IN PROGRESS: Special Issue Call for Papers: Design and Management of Mobile Platforms - Papers Due: 31 July 2019; Guest Editor Contact: Umit Y. Ogras ([email protected])
- IN PROGRESS: Special Issue Call for Papers: Autonomous Systems Design - Papers Due: 28 June 2019; Guest Editor Contact: Selma Saidi ([email protected])
- IN PROGRESS: Special Issue Call for Papers: Robust Resource-Constrained Systems for Machine Learning - Papers Due: 20 April 2019; Guest Editor Contact: Theo Theocharides ([email protected])
- PAST: Special Issue Call for Papers: Machine Intelligence at the Edge - Papers Due: 8 March 2019; Guest Editor Contact: Deming Chen ([email protected])
- PAST: Special Issue Call for Papers: Event-Triggered Circuits and Systems for Sparse Information Processing - Papers Due: March 31st, 2019; Guest Editor Contact: Subhanshu Gupta ([email protected])
- PAST: Special Issue Call for Papers: Intelligent Resource-Constrained Sensor Nodes- Papers Due: August 15th, 2018; Guest Editor Contact: Shreyas Sen ([email protected])
- PAST: Special Issue Call for Papers: Embedded Intelligence in the Internet-of-Things- Papers Due: September 14th, 2018; Guest Editor Contact: Robert P. Dick (dickrp
@umich.edu) - PAST: Special Issue Call for Papers: Smart and Autonomous Systems for Sustainability: Sustainable Computing and Computing for Sustainability- Papers Due: August 1st, 2018; Guest Editor Contact: Jana Doppa (jana
@eecs.wsu.edu) - PAST: Special Issue Call for Papers: Circuits and Systems for VLSI Internet-of-Things (IoT) Devices- Papers Due: June 15th, 2018; Guest Editor Contact: Marilyn C Wolf ([email protected])
- PAST: Special Issue Call for Papers: Cyber Security for Embedded Controls in Cyber-Physical Systems- Papers Due: January 15th, 2018
Call for Special Issue Proposals
Design&Test has a strong history of Special Issues that often set new trends or even established new research branches with respect to design and test aspects. These are leading-edge, forward-looking topics by Guest Editors who are the leaders in their respective fields. Design&Test always seeks high-profile Guest Editors to conduct Special Issues in the magazine. Though proposals are often solicited by the Editor-In-Chief (EIC) or Members of the Editorial Board, it is highly encouraged to send an unsolicited proposal to the EiC.
Please send your proposal to Jörg Henkel, Karlsruhe Institute of Technology, ([email protected]).
Detailed guidelines for submitting Special Issue proposals can be found here.
General Call for Papers
IEEE Design&Test Magazine seeks original and visionary research work describing methods used to design and test from the physical layer all the way up to things and systems of systems. Besides research articles, the magazine focuses on current and future practice in the form of perspectives, interviews, roundtables, tutorials, standards, reviews, and reports.
Topics of Interest include, but are not limited to:
IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards. IEEE Design & Test is co-sponsored with the IEEE Council on Electronic Design and Automation, IEEE Circuits and Systems Society, the IEEE Solid-State Circuits Society and the Test Technology Technical Council.
Authors can submit manuscripts for publication on any topic within Design & Test's scope at any time. All articles are peer-reviewed before publication and are limited in length by 5,000 words (each figure counts 300 words). In addition to research articles, Design & Test publishes numerous columns to which you can also contribute. If interested in contributing to a column, please contact the specific editor (see back page of this flyer).
