Current Calls

In Progress

 

Call for Special Issue Proposals

Design&Test has a strong history of Special Issues that often set new trends or even established new research branches with respect to design and test aspects. These are leading-edge, forward-looking topics by Guest Editors who are the leaders in their respective fields. Design&Test always seeks high-profile Guest Editors to conduct Special Issues in the magazine. Though proposals are often solicited by the Editor-In-Chief (EIC) or Members of the Editorial Board, it is highly encouraged to send an unsolicited proposal to the EiC.

Please send your proposal to Jörg Henkel, Karlsruhe Institute of Technology, ([email protected]).

Detailed guidelines for submitting Special Issue proposals can be found here.

General Call for Papers

IEEE Design&Test Magazine seeks original and visionary research work describing methods used to design and test from the physical layer all the way up to things and systems of systems. Besides research articles, the magazine focuses on current and future practice in the form of perspectives, interviews, roundtables, tutorials, standards, reviews, and reports.

Topics of Interest include, but are not limited to:

 

cfp


IEEE Design & Test offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards. IEEE Design & Test is co-sponsored with the IEEE Council on Electronic Design and Automation, IEEE Circuits and Systems Society, the IEEE Solid-State Circuits Society and the Test Technology Technical Council.

Authors can submit manuscripts for publication on any topic within Design & Test's scope at any time. All articles are peer-reviewed before publication and are limited in length by 5,000 words (each figure counts 300 words). In addition to research articles, Design & Test publishes numerous columns to which you can also contribute. If interested in contributing to a column, please contact the specific editor (see back page of this flyer).

    Design&Test is a co-sponsored publication of IEEE CEDA, SSCS, and CASS.