Editor-In-Chief

Jörg Henkel

EiC, Design&Test
Karlsruhe Inst. of Tech.
IEEE Region: 8

Assoc. Editor-In-Chief

Partha Pratim Pande

Assoc. EiC, Design&Test
Washington State University
IEEE Region: 6

Cover Design

Alex Torres

Cover Design

Technical Areas

Analog, Asynchronous, & Mixed Signal

Haralampos Stratigopoulos

Sorbonne Universités, CNRS
IEEE Region: 8

Embedded Software

Petru Eles

Linköping University
IEEE Region: 8

Emerging Technologies & Devices

Mircea Stan

University of Virginia
IEEE Region: 3

Yiran Chen

Duke University
IEEE Region: 3

Interconnect

Partha Pratim Pande

Assoc. EiC, Design&Test Washington State University
IEEE Region: 6

Umit Ogras

Arizona State University
IEEE Region: 6

Sudeep Pasricha

Web/Social Media Colorado State Univ.
IEEE Region: 5

Things & Systems of Systems

Tei-Wei Kuo

NTU, Taiwan
IEEE Region: 10

Paul Bogdan

University of Southern California
IEEE Region: 6

Mohammad Al Faruque

UC Irvine, USA
IEEE Region: 6

Security & Trust

Ramesh Karri

New York University
IEEE Region: 1

Deep-Submicron Design, DFM & Yield

Vivek De

Intel

Low Power Systems

Anand Raghunathan

Purdue University

Memories

Said Hamdioui

TU Delft, Netherlands

Binoy Ravindran

Virginia Tech, USA

Multicores

Tulika Mitra

National University of Singapore
IEEE Region: 10

Chia-Lin Yang

National Taiwan Univ.
IEEE Region: 10

Keynotes

Xiaobo Sharon Hu

University of Notre Dame
IEEE Region: 4

Patrick Groeneveld

Synopsys Inc.

Sri Parameswaran

EiC, Embedded Systems Letters The Univ. of New South Wales
IEEE Region: 10

Physical Design

David Pan

Electron Devices Univ. of Texas at Austin
IEEE Region: 5

Real-Time & Mixed Criticality

Jian Jia Chen

University of Dortmund, Germany
IEEE Region: 8

Reliability

Sanghamitra Roy

Utah State University

Self-Aware & Adaptive Systems

Axel Jantsch

Vienna University, Austria
IEEE Region: 8

Laura Pozzi

University of Lugano, Switzerland
IEEE Region: 8

SoC & 3D

Sung Kyu Lim

Georgia Tech

Jin-Fu Li

National Central University
IEEE Region: 10

Nicola Nicolici

McMaster University
IEEE Region: 7

Cecilia Metra

Computer University of Bologna, Italy
IEEE Region: 8

Test & Verification Techniques

Fei Su

Intel

John Carulli

Globalfoundries

Xin Li

Deputy EiC, IEEE TCAD Duke University
IEEE Region: 3

Shreyas Sen

Purdue University, USA

Departments

Interviews

Yao-Wen Chang

President-Elect, Strategy Chair National Taiwan University
IEEE Region: 10

Magdy Abadir

Freescale Semiconductor

Newsletters

CEDA CURRENTS

Vasilis Pavlidis

VP Publicity University of Manchester, UK
IEEE Region: 8
TTTC Newsletter

Theo Theocharides

University of Cyprus
IEEE Region: 8
DATC Newsletter

Tutorials

Swarup Bhunia

Case Western Reserve University

Juergen Teich

FAU Erlagen
IEEE Region: 8

Reports

Yervant Zorian

Test Technology TC (TTTC) Synopsys
IEEE Region: 6

Massimo Poncino

Politecnico di Torino, Italy
IEEE Region: 8

Publicity

Mohammad Al Faruque

UC Irvine, USA
IEEE Region: 6

Reviews

Roundtables

Rajesh K. Gupta

EiC, TCAD University of California, San Diego
IEEE Region: 6

The Last Byte

The Road Ahead

Andrew Kahng

University of California, San Diego
IEEE Region: 6

Perspectives

David Atienza

President, Fellows EPFL, Switzerland
IEEE Region: 8

Sri Parameswaran

EiC, Embedded Systems Letters The Univ. of New South Wales
IEEE Region: 10

Ahmed Jerraya

CEA-LETI
IEEE Region: 8

Hidetoshi Onodera

VP Awards Kyoto University

Steering Committee

L. Miguel Silveira

VP Publications INESC-ID, Lisbon, Portugal
IEEE Region: 8

Bruce Hecht

Analog Devices

Krishnendu Chakrabarty

Duke University

Enrico Macii

Circuits and Systems Politecnico di Torino
IEEE Region: 8

Yervant Zorian

Test Technology TC (TTTC) Synopsys
IEEE Region: 6

IEEE Production Staff

IEEE Periodicals/Magazines Department

445 Hoes Lane, Piscataway,
NJ 08854 USA

 

Senior Director, Publishing Operations

Dawn Melley
[email protected]

Director, Editorial Services

Kevin Lisankie
[email protected]

Senior Managing Editor

Patrick Kempf
[email protected]

Assoc. Dir., Editorial Services

Jeffrey E. Cichocki
[email protected]

Associate Director, Info. Conversion/Editorial Support

Neelam Khinvasara
[email protected]

Director, Production Services

Peter M. Tuohy
[email protected]

Journals Coordinator

Laura Ambrosio
[email protected]

Production Coordinator

Theresa L. Smith
[email protected]

Advertising Production Manager

Felicia Spagnoli
[email protected]


Design&Test is a co-sponsored publication of IEEE CEDA, SSCS, and CASS.