Editor-In-Chief

Jörg Henkel

EiC, Design&Test
Karlsruhe Inst. of Tech.
IEEE Region: 8

Assoc. Editor-In-Chief

Partha Pratim Pande

Assoc. EiC, Design&Test
Washington State University
IEEE Region: 6

Cover Design

Technical Areas

Analog, Asynchronous, & Mixed Signal

Haralampos Stratigopoulos

Sorbonne Universités, CNRS
IEEE Region: 8

Embedded Software

Petru Eles

Linköping University
IEEE Region: 8

Emerging Technologies & Devices

Mircea Stan

University of Virginia
IEEE Region: 3

Yiran Chen

Duke University
IEEE Region: 3

Interconnect

Partha Pratim Pande

Assoc. EiC, Design&Test
Washington State University
IEEE Region: 6

Umit Ogras

Arizona State University
IEEE Region: 6

Sudeep Pasricha

Web/Social Media
Colorado State Univ.
IEEE Region: 5

Things & Systems of Systems

Tei-Wei Kuo

NTU, Taiwan
IEEE Region: 10

Paul Bogdan

University of Southern California
IEEE Region: 6

Mohammad Al Faruque

UC Irvine, USA
IEEE Region: 6

Security & Trust

Ramesh Karri

New York University
IEEE Region: 1

Deep-Submicron Design, DFM & Yield

Low Power Systems

Anand Raghunathan

Purdue University

Memories

Said Hamdioui

TU Delft, Netherlands

Binoy Ravindran

Virginia Tech, USA

Multicores

Tulika Mitra

National University of Singapore
IEEE Region: 10

Chia-Lin Yang

National Taiwan Univ.
IEEE Region: 10

Keynotes

Xiaobo Sharon Hu

Fellow Evaluation Chair
University of Notre Dame
IEEE Region: 4

Sri Parameswaran

EiC, Embedded Systems Letters
The Univ. of New South Wales
IEEE Region: 10

Physical Design

David Pan

Electron Devices
Univ. of Texas at Austin
IEEE Region: 5

Real-Time & Mixed Criticality

Jian Jia Chen

University of Dortmund, Germany
IEEE Region: 8

Reliability

Sanghamitra Roy

Utah State University

Self-Aware & Adaptive Systems

Axel Jantsch

Vienna University, Austria
IEEE Region: 8

Laura Pozzi

University of Lugano, Switzerland
IEEE Region: 8

SoC & 3D

Sung Kyu Lim

Georgia Tech

Jin-Fu Li

National Central University
IEEE Region: 10

Nicola Nicolici

McMaster University
IEEE Region: 7

Cecilia Metra

Computer
University of Bologna, Italy
IEEE Region: 8

Test & Verification Techniques

Xin Li

Deputy EiC, IEEE TCAD
Duke University
IEEE Region: 3

Shreyas Sen

Purdue University, USA

Departments

Interviews

Yao-Wen Chang

President
National Taiwan University
IEEE Region: 10

Magdy Abadir

Freescale Semiconductor

Newsletters

CEDA CURRENTS

Vasilis Pavlidis

VP Publicity
University of Manchester
IEEE Region: 8
TTTC Newsletter

Theo Theocharides

University of Cyprus
IEEE Region: 8
DATC Newsletter

Tutorials

Swarup Bhunia

Case Western Reserve University

Juergen Teich

FAU Erlagen
IEEE Region: 8

Reports

Yervant Zorian

Test Technology TC (TTTC)
Synopsys
IEEE Region: 6

Massimo Poncino

Politecnico di Torino, Italy
IEEE Region: 8

Publicity

Mohammad Al Faruque

UC Irvine, USA
IEEE Region: 6

Reviews

Roundtables

Rajesh K. Gupta

EiC, TCAD
University of California, San Diego
IEEE Region: 6

The Last Byte

The Road Ahead

Andrew Kahng

University of California, San Diego
IEEE Region: 6

Perspectives

David Atienza

Immediate Past President
EPFL
IEEE Region: 8

Sri Parameswaran

EiC, Embedded Systems Letters
The Univ. of New South Wales
IEEE Region: 10

Ahmed Jerraya

CEA-LETI
IEEE Region: 8

Hidetoshi Onodera

VP Awards
Kyoto University

Steering Committee

L. Miguel Silveira

VP Publications
INESC-ID
IEEE Region: 8

Krishnendu Chakrabarty

Duke University

Enrico Macii

VP Strategy
Politecnico di Torino
IEEE Region: 8

Yervant Zorian

Test Technology TC (TTTC)
Synopsys
IEEE Region: 6

IEEE Production Staff

IEEE Periodicals/Magazines Department

445 Hoes Lane, Piscataway,
NJ 08854 USA

 

Senior Director, Publishing Operations

Dawn Melley
[email protected]

Director, Editorial Services

Kevin Lisankie
[email protected]

Senior Managing Editor

Patrick Kempf
[email protected]

Assoc. Dir., Editorial Services

Jeffrey E. Cichocki
[email protected]

Associate Director, Info. Conversion/Editorial Support

Neelam Khinvasara
[email protected]

Director, Production Services

Peter M. Tuohy
[email protected]

Journals Coordinator

Laura Ambrosio
[email protected]

Production Coordinator

Theresa L. Smith
[email protected]

Advertising Production Manager

Felicia Spagnoli
[email protected]


Design&Test is a co-sponsored publication of IEEE CEDA, SSCS, and CASS.