Editor-In-Chief

Jörg Henkel

EiC, Design&Test
Karlsruhe Inst. of Tech.
IEEE Region: 8

Assoc. Editor-In-Chief

Partha Pratim Pande

Assoc. EiC, Design&Test
Washington State University

Technical Areas

Analog, Asynchronous, & Mixed Signal

Haralampos Stratigopoulos

Sorbonne Universités, CNRS
IEEE Region: 8

Sule Osev

Arizona State University

Steven Nowick

Columbia University
IEEE Region: 1

Low Power Systems

Anand Raghunathan

Purdue University

Youngsoo Shin

KAIST, South Korea
IEEE Region: 10

Security & Trust

Ramesh Karri

New York University
IEEE Region: 1

Deep-Submicron Design, DFM & Yield

Vivek De

Intel

Memories

Said Hamdioui

TU Delft, Netherlands

Binoy Ravindran

Virginia Tech, USA

Self-Aware & Adaptive Systems

Laura Pozzi

University of Lugano, Switzerland
IEEE Region: 8

Embedded Software

Wang Yi

Uppsala University, Sweden
IEEE Region: 8

Petru Eles

Linkoping University

Multicores

Tulika Mitra

National University of Singapore
IEEE Region: 10

Chia-Lin Yang

National Taiwan Univ.
IEEE Region: 10

SoC & 3D

Nicola Nicolici

McMaster University
IEEE Region: 7

Cecilia Metra

Computer University of Bologna, Italy
IEEE Region: 8

Jin-Fu Li

National Central University, Taiwan
IEEE Region: 10

Emerging Technologies & Devices

Mircea Stan

University of Virginia
IEEE Region: 3

Yiran Chen

Duke University
IEEE Region: 3

Physical Design

Sung Kyu Lim

Georgia Tech

Steve Wilton

University of British Columbia, Canada
IEEE Region: 7

David Pan

Electron Devices Univ. of Texas at Austin
IEEE Region: 5

Test & Verification Techniques

Yiorgos Makris

Univ. of Texas at Dallas
IEEE Region: 5

Xin Li

Deputy EiC, IEEE TCAD Duke University
IEEE Region: 3

Li-C. Wang

UC Santa Barbara, USA
IEEE Region: 6

Shreyas Sen

Purdue University, USA

Interconnect

Partha Pratim Pande

Assoc. EiC, Design&Test Washington State University

Sudeep Pasricha

Web/Social Media Colorado State Univ.
IEEE Region: 5

Reliability

Sanghamitra Roy

Utah State University

Things & Systems of Systems

Tei-Wei Kuo

NTU, Taiwan
IEEE Region: 10

Paul Bogdan

University of Southern California
IEEE Region: 6

Keynotes

Xiaobo Sharon Hu

University of Notre Dame
IEEE Region: 4

Patrick Groeneveld

Synopsys Inc.

Real-Time & Mixed Criticality

Jian Jia Chen

University of Dortmund, Germany
IEEE Region: 8

Departments

Interviews

Yao-Wen Chang

President-Elect, Strategy Chair National Taiwan University
IEEE Region: 10

Magdy Abadir

Freescale Semiconductor

Reports

Massimo Poncino

Politecnico di Torino, Italy
IEEE Region: 8

Yervant Zorian

Test Technology TC (TTTC) Synopsys
IEEE Region: 6

The Last Byte

Newsletters

CEDA CURRENTS

Vasilis Pavlidis

VP Publicity University of Manchester, UK
IEEE Region: 8
TTTC Newsletter

Theo Theocharides

University of Cyprus
IEEE Region: 8
DATC Newsletter

Reviews

Igor Markov

University of Michigan
IEEE Region: 4

The Road Ahead

Andrew Kahng

University of California, San Diego
IEEE Region: 6

Perspectives

Yervant Zorian

Test Technology TC (TTTC) Synopsys
IEEE Region: 6

Roundtables

Rajesh K. Gupta

EiC, TCAD University of California, San Diego
IEEE Region: 6

Tutorials

Swarup Bhunia

Case Western Reserve University

Juergen Teich

FAU Erlagen
IEEE Region: 8

Publicity

Mohammad Al Faruque

UC Irvine, USA

Standards

Bill Eklow

Cisco, USA

Anne Gattiker

IBM- Austin Research Lab
IEEE Region: 5

Alliance Program

DTAP Chair

Yervant Zorian

Test Technology TC (TTTC) Synopsys
IEEE Region: 6

Asia

Hidetoshi Onodera

VP Awards Kyoto University

DAC

Andrew Kahng

University of California, San Diego
IEEE Region: 6

TTTC

Michael Nicolaidis

TIMA
IEEE Region: 8

DATE

Ahmed Jerraya

CEA-LETI
IEEE Region: 8

Latin America

Ricardo Reis

Universidade Federal do Rio Grande do Sul
IEEE Region: 9

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Duke University

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Circuits and Systems Politecnico di Torino
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IEEE Region: 8

Yervant Zorian

Test Technology TC (TTTC) Synopsys
IEEE Region: 6

Bruce Hecht

Analog Devices

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