IEEE Design&Test (D&T)

Aim & Scope

IEEE Design&Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and round-table discussions.

Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

IEEE Design&Test offers original works describing the methods used to design and test electronic product hardware and supportive software. The magazine focuses on current and near-future practice and includes tutorials, how-to articles, and real-world case studies. Topics include IC/module design, low-power design, electronic design automation, design/test verification, practical technology, and standards.

IEEE Design&Test is cosponsored with the IEEE Council on Electronic Design and Automation, IEEE Circuits and Systems Society, and the IEEE Solid-State Circuits Society.


IEEE D&T issues are available through IEEE Xplore. Only electronic submissions will be considered. Detailed instructions are posted on the web at https://mc.manuscriptcentral.com/dandt.

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Abstracting is permitted with credit to the source. Libraries are permitted to photocopy for private use of patrons, provided the per-copy fee indicated in the code at the bottom of the first page is paid through the Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923.

Submission Information

Submit a Word, pdf, text, or PostScript version of your submission to ScholarOne Manuscripts.

Editorial

Unless otherwise stated, bylined articles and columns, as well as product and service descriptions, reflect the author’s or firm’s opinion. Inclusion in IEEE Design&Test does not necessarily constitute endorsement by IEEE. All submissions are subject to editing for style, clarity, and length.

Subscription Rates

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Copyright and Reprint Permissions

Abstracting is permitted with credit to the source. Libraries are permitted to photocopy beyond the limits of U.S. Copyright law for the private use of patrons 1) those post-1977 articles that carry a code at the bottom of the first page, provided the per-copy fee indicated in the code is paid through the Copyright Clearance Center, 222 Rosewood Drive, Danvers, MA 01923 USA; 2) pre-1978 articles without fees.

For other copying, reprint, or republication permission, write Copyrights and Permissions Department, IEEE Operations Center, 445 Hoes Lane, Piscataway, NJ 08854 USA. Copyright 2013 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Periodicals postage paid at New York, NY, and at additional mailing offices.

Postmaster

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Design&Test Editor-in-Chief

Personnel:

Partha Pratim Pande

Washington State University
United States
6 (Western U.S.)