The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics, and new trends in the area of electronic-based circuit and system testing and reliability.
ASP-DAC 2017 is the twenty-second annual international conference on VLSI design automation in Asia and South Pacific region, one of the most active regions of design and fabrication of silicon chips in the world.
The Electronic Design Process Symposium (EDPS) and Workshop on Efficient Design and Manufacturing, in its 24th year, fosters the free exchange of ideas among the top thinkers, movers, and shakers who focus on how chips and systems are designed in the electronics industry.
14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design 2017
SMACD is a forum devoted to Design Methods and Tools for Analog, Mixed-signal, RF (AMS/RF) and multi-domain (MEMS, nanoelectronic, optoelectronic, biological, etc.) integrated circuits and systems.
SBCCI is an international forum dedicated to integrated circuits and systems design, test and electronic designautomation (EDA), held annually in Brazil. The 30th SBCCI will take place in Fortaleza, capital of the State of Ceará.
The IEEE Latin-American Test Symposium (LATS, previously Latin-American Test Workshop - LATW) is a recognized forum for test and fault tolerance professionals and technologists from all over the world, in particular from Latin America, to present and discuss various aspects of system, board, and