John Carulli IEEE Region: 6 (Western U.S.) Email Biography John Carulli leads the Test organization at GLOBALFOUNDRIES Fab8 in Malta, NY working on leading-edge CMOS technologies. He previously had 21 years at Texas Instruments where he was a Distinguished Member of the Technical Staff. While in the Analog Engineering Operations organization he led test and design data mining methods targeted at test cost reduction. Prior to that in the Silicon Technology Development organization, he was the Manager of the Product Reliability group responsible for product and design reliability activities for new technology development. John holds 7 US Patents. He has over 50 publications in the areas of reliability, test, and process development. He is co-recipient of two Best Paper Awards and two Best Paper Nominations working in close collaboration with university partners. John serves on the organizing or program committees of several conferences including the International Test Conference, VLSI Test Symposium, and European Test Symposium. He is a Senior Member of IEEE. He received his B.S.E.E. and M.S.E.E. degrees from the University of Vermont in Burlington, VT. His research interests include product reliability, outlier analysis, machine learning, performance modeling, logic diagnosis, and security. Position(s) & Affiliation(s) GlobalFoundries United States
