Technical Committees

To assure grounding in the major technology activities of the electronic design automation field, the Council has Member Technology Organizations from specific conferences, publications, and organizations. The Organizations bring information on the activities and directions of the EDA/CAD field.


Design Automation Technical Committee

The Design Automation Technical Committee (DATC) mission is to provide a forum for discussion of strategic and topical issues in design automation, including coordinating efforts to produce publicly available design flows and test cases and to arrange workshops, meetings, activities, and publications on related topics.



Hardware Security and Trust Technical Committee

The Hardware Security and Trust Technical Committee (HSTTC) was created to help researchers better understand the challenges and risks in the hardware security and trust (S&T) domain and to help both academia and industry to develop countermeasures and solutions to hardware S&T problems.

HSTTC Chair

  • Country
    USA
    Affiliation
    University of Maryland
    IEEE Region
    Region 02 (Eastern U.S.)


System Validation and Debug Technology Committee

The IEEE CEDA System Validation and Debug Technology Committee (SVDTC) brings together passionate experts from Industry and Academia globally, in order to collaboratively address the Industry needs in and around the technology of System validation and Debug (SVD) for silicon-based information and communication systems -- from soup to nuts.
 



Technical Committee on Cyber-Physical Systems

The IEEE Technical Committee (TC) on Cyber-Physical Systems (CPS) is an IEEE constituency overseeing all technical activities related to designs, implementations, and operations of CPSs. CPS addresses the close interactions and feedback loop between the cyber sensing components and the dynamic physical components, using big data analytics.



Test Technology Technical Council

Test Technology Technical Council (TTTC)’s interests encompass a wide variety of technologies since each area of electronic test depends on its own specialized instrumentation and techniques. A number of technologies are usually needed to test a single product thereby increasing the challenge.

TTTC Chair

  • Country
    USA
    Affiliation
    IBM Thomas J. Watson Research Center
    IEEE Region
    Region 01 (Northeastern U.S.)