Sandeep Kumar Goel is a DFT/3D-Test Manager with Taiwan Semiconductor Manufacturing Company (TSMC), San Jose, CA. He received his Ph.D. degree from the University of Twente, The Netherlands. Prior to TSMC, he was in various research and management positions with LSI Corporation CA, Magma Design Automation, CA, and Philips Research, The Netherlands. He has co-authored two books, three book chapters, and published over 75 papers in journals and conference/workshop proceedings. He has delivered several invited talks and has been a panelist at several conferences. He is a co-inventor on eight granted U.S. and European patents and has over 20 other patents pending. His current research interests include all topics in the domain of testing, diagnosis and failure analysis of 2D/3D chips. Dr. Goel was a recipient of the Most Significant Paper Award at the IEEE International Test Conference in 2010. He serves on various conference committees including DATE, ETS, ITC, DATA, and 3DTest. He was the General Chair of 3D Workshop at DATE 2012. He is a senior member of the IEEE.