2022 IEEE Latin American Test Symposium

The IEEE Latin-American Test Symposium (LATS) is a recognized test and fault tolerance techniques forum attended by professionals from all over the world, in particular from Latin-America, to present and discuss various aspects of system, board, and component testing as well as design, manufacturing and in-field considerations with fault tolerance in mind. Accepted papers will be submitted for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements. Further, the best papers of its 23rd edition will be invited to re-submit to IEEE D&T, Journal of Electronic Testing: Theory and Applications (JETTA - Springer) and IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD).