2024 25th IEEE Latin American Test Symposium

The IEEE Latin-American Test Symposium (LATS) is a recognized forum dedicated to presenting and discussing scientific results, emerging ideas, applications, hot topics and new trends in the area of electronic-based circuits and system testing, reliability, and security. LATS is attended by professionals from all over the world, in particular from Latin-America. Accepted papers will be submitted for inclusion into IEEE Xplore subject to meeting IEEE Xplore’s scope and quality requirements. Selected papers of its 25th edition will be considered for publication in a special issue of "Microelectronics Reliability“ (Elsevier) after the regular journal review process. Further, a selection of papers is invited to be re-submit to Journal of Electronic Testing: Theory and Applications (JETTA - Springer).