Skip to main content
  • IEEE.org
  • IEEE Xplore Digital Library
  • IEEE Standards
  • IEEE Spectrum
  • More Sites
IEEE
Home
    • About Us
      • About CEDA
      • Member Societies
      • History
      • Council Presidents
    • Leadership
      • Executive Committee
      • Board of Governors
    • Governing Documents
      • Constitution & Bylaws
      • Minutes & Presentations
    • Publicity
      • Publicity Resources
      • YouTube Presentations
    • Staff
      • Operations Manager
    • Awards & Recognitions Program
      • About Awards & Recognitions Program
    • Council Awards
      • Chapter of the Year
      • Distinguished Service Award
      • Ernest S. Kuh Early Career Award
      • Phil Kaufman Award
      • Phil Kaufman Hall of Fame
    • Publications Awards
      • A. Richard Newton Award
      • Donald O. Pederson Award
    • Conference Awards
      • Outstanding Service Recognition
      • William J McCalla Award
    • IEEE Awards
      • Fellows
    • Education
      • Distinguished Lecturer Program
      • Virtual Distinguished Lecturer Program
      • CAD for Assurance
      • Design Automation Webinars
    • Chapters
      • Chapter Listings
      • Chapter Resources
    • Students and YP
      • Students
      • Student Travel Program
      • Young Professionals
    • Diversity, Equity, & Inclusion
      • About
      • Women in Technology at DAC
      • DivEDA at DATE
      • IEEE WIE
    • Technical Operations
      • About Technical Operations
      • Technical Committees
    • About Conferences
      • About Conferences
      • Conference Listing
    • Event Calendar
      • Conference Calendar
    • About Publications
      • About Publications
      • Currents Newsletter
      • Subscribe to Newsletter
    • Transactions on Computer-Aided Design of Integrated Circuits & Systems
      • About TCAD
      • TCAD's Editorial Corner
      • Editorial Board
      • Call for Papers
      • Instructions for Authors
      • Current Issue
      • Donald O. Pederson Award
    • Embedded Systems Letters
      • About ESL
      • Editorial Board
      • Special Issues
      • Instructions for Authors
      • Apply to Become External Reviewer
      • Current Issue
    • Co-Sponsored Publications
      • IEEE Design&Test (D&T)
      • IEEE Internet of Things Magazine (IoTM)
      • IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JxCDC)
      • IEEE Transactions on Circuits and Systems for Artificial Intelligence (TCASAI)
      • IEEE Transactions on Signal and Power Integrity (TSPI)
      • IEEE Transactions on Sustainable Computing (T-SUSC)

      • About CEDA
      • Member Societies
      • History
      • Council Presidents
      • Executive Committee
      • Board of Governors
      • Constitution & Bylaws
      • Minutes & Presentations
      • Publicity Resources
      • YouTube Presentations
      • Operations Manager
      • About Awards & Recognitions Program
      • Chapter of the Year
      • Distinguished Service Award
      • Ernest S. Kuh Early Career Award
      • Phil Kaufman Award
      • Phil Kaufman Hall of Fame
      • A. Richard Newton Award
      • Donald O. Pederson Award
      • Outstanding Service Recognition
      • William J McCalla Award
      • Fellows
      • Distinguished Lecturer Program
      • Virtual Distinguished Lecturer Program
      • CAD for Assurance
      • Design Automation Webinars
      • Chapter Listings
      • Chapter Resources
      • Students
      • Student Travel Program
      • Young Professionals
      • About
      • Women in Technology at DAC
      • DivEDA at DATE
      • IEEE WIE
      • About Technical Operations
      • Technical Committees
      • About Conferences
      • Conference Listing
      • Conference Calendar
      • About Publications
      • Currents Newsletter
      • Subscribe to Newsletter
      • About TCAD
      • TCAD's Editorial Corner
      • Editorial Board
      • Call for Papers
      • Instructions for Authors
      • Current Issue
      • Donald O. Pederson Award
      • About ESL
      • Editorial Board
      • Special Issues
      • Instructions for Authors
      • Apply to Become External Reviewer
      • Current Issue
    • IEEE Design&Test (D&T)
    • IEEE Internet of Things Magazine (IoTM)
    • IEEE Journal on Exploratory Solid-State Computational Devices and Circuits (JxCDC)
    • IEEE Transactions on Circuits and Systems for Artificial Intelligence (TCASAI)
    • IEEE Transactions on Signal and Power Integrity (TSPI)
    • IEEE Transactions on Sustainable Computing (T-SUSC)

Breadcrumb

  • Home
  • Contact
  • Sayandeep Saha
Sayandeep Saha
India

Sayandeep Saha

Affiliation
Indian Institute of Technology Kharagpur
IEEE Region
Region 10 (Asia and Pacific)

Contact Menu

Presentations
  • Webinar
    Title

    ExpFault: Automated Framework for Exploitable Fault Characterization in Block Ciphers -and- Automated Hardware Trojan Benchmarking

    Presenter
    Debdeep Mukhopadhyay; Sayandeep Saha; Jonathan Cruz; Patanjali SLPSK
    Date
    11 June 2021
    Series
    CAD for Assurance
Outdated or incorrect information? Please click here to update us with the correct information.

Follow CEDA

Subscribe to Our Email List
  • IEEE Home
  • More IEEE Sites

© Copyright 2025 IEEE – All rights reserved. Use of this website signifies your agreement to the IEEE Terms & Disclosures.

A public charity, IEEE is the world's largest technical professional organization dedicated to advancing technology for the benefit of humanity.

This site is created, maintained, and managed by Conference Catalysts, LLC.
Please feel free to contact us for any assistance.