Elena-Ioana Vatajelu is a CNRS Research Scientist at TIMA Laboratory, Grenoble, France working on the design, reliability, and test of Integrated Circuits. She obtained her Ph.D. from the Polytechnic University of Catalunya in 2011 in Electronic Engineering. Her expertise is in reliability and robustness assessment, design-for-reliability, test strategies, and security primitives for CMOS and beyond CMOS RAMs in traditional and non-Von Neumann computing paradigms. In recent years she has started researching the use of emerging memory technologies for neuromorphic applications. She has published 60+ journal and conference papers in the area of dependable memories. She served as program chair of the IEEE European Test Symposium (ETS) 2021, and of IEEE Conference on Design & Technology of Integrated Systems 2019. During the last 10 years, she served as a program committee member of various international conferences and symposia, as well as associate editor, guest-editor, and reviewer for various international journals.