Dr. Sheldon Tan is a Professor in the Department of Electrical Engineering, University of California, Riverside, CA.  He is the Associate Director of Compute Engineering Program (CEN) and cooperative faculty member in the Department of Computer Science and Engineering at UCR. Dr. Sheldon Tan received his B.S. and M.S. degrees in electrical engineering from Fudan University, Shanghai, China in 1992 and 1995, respectively, and the Ph.D. degree in electrical and computer engineering from the University of Iowa, Iowa City, in 1999.  He is a visiting professor of Kyoto University as a JSPS Fellow since Dec. 2017. His research interests include machine and deep learning for VLSI reliability modeling and optimization at circuit and system levels, machine learning for circuit and thermal simulation, thermal modeling, optimization, and dynamic thermal management for many-core processors. He has published more than 320 technical papers and has co-authored 6 books on those areas.  Dr. Tan received NSF CAREER Award in 2004. He also received Best Paper Awards from ICSICT'18, ASICON’17, ICCD'07, DAC’09. He also received ASPDAC Prolific Author Award in 2020. He also received the Honorable Mention Best Paper Award from SMACD’18. He was a Visiting Professor of Kyoto University as a JSPS Fellow from Dec. 2017 to Jan. 2018. He will also serve CEDA Distinguished Lecturer for 2022-2023.  He has served as TPC Chair for ASPDAC 2021, and the TPC Vice Chair for ASPDAC 2020.  He is serving or served as Editor in Chief for Elsevier’s Integration, the VLSI Journal, the Associate Editor for three journals: IEEE Transaction on VLSI Systems (TVLSI), ACM Transaction on Design Automation of Electronic Systems (TODAES), and Elsevier’s Microelectronics Reliability.