CEDA publishes journals and newsletters to inform the EDA community on industry news and research results.

Current CEDA Publications

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D&T Cover

IEEE Design&Test (D&T)

IEEE Design&Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and round-table discussions.

Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

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IEEE Embedded Systems Letters (ESL)

IEEE EMBEDDED SYSTEMS LETTERS seeks to provide a forum of quick dissemination of research results in the domain of embedded systems with a target turnaround time of no more than three months.

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TCAD Cover

IEEE Transactions on Computer Aided Design of Integrated Circuits & Systems (TCAD)

The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, test-ability, and security are a focus.

CEDA Technical Co-sponsored Publications